CREM

The CREM technique is a novel development focusing on the derivation of electrical properties, directly from the XPS data.
CREM modes & applications already demonstrated include:

• I-V curves of selected regions within heterostructures
• Characterization of the electric breakdown channels in dielectric spacers
• Gate oxide quality & hot-e^- characteristics
• A novel spectroscopy of charge traps in wide bandgap materials
• Work function measurements in non-uniform systems
• Photo-voltaic measurements at selected regions
• Measuring internal fields and constructing ‘correct’ band diagrams of devices
• Pyro-electricity - a unique non-contact approach to
• Capacitance and charge capturing characterization
• Applications to organic and bio molecules – approaching atomic scale resolution
• Nano scale electron transport characteristics
• Non-damaging depth profiling (towards 3D- imaging capabilities)