Instrument Specification
The AXIS Ultra DLD spectrometer combines state-of-the-art XPS performance with unrivalled automation and ease of use.
This instrument excels in both spectroscopy and imaging modes and has the flexibility to incorporate complementary surface analytical techniques, including (see details below) (1) Ultra-violet photoelectron spectroscopy (UPS); (2) Auger electron spectroscopy (AES); (3) Ion inelastic scattering (ISS); and (4) Chemically resolved electrical measurements (CREM).
Staff Contacts
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Dr. Hagai Cohen
Staff Scientist -
Dr. Tatyana Bendikov
Staff Scientist