Instrument Specification
XRF spectrometry allows quantitative compositional analysis of solid and liquid samples in ambient and inert environments. The method analyses bulk volume of material and is sensitive enough to detect trace elements in amount as low as a fraction of percent. Since same volume of material as during X-ray diffraction is measured it can provide significant advantage for phase analysis.
Location
Kimmelman Building, room 151
Staff Contacts
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Dr. Anna Eden Kossoy
Staff Scientist