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Faculty of Chemistry

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Electron Microscopy

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electron-microscopy

Single particle cryo-EM

Biological TEM

Single particle cryo-EM

Single particle cryo-EM is used for determining the 3D structure of biological macromolecules such as proteins and nucleic acid complexes. The technique involves imaging of many (tens or hundreds of thousands) copies of a purified macromolecule under cryo-conditions. Then…

Electron tomography

Biological TEM

Electron tomography

Tomography is a method where multiple images of a unique object are taken at a range of angular views. These images are combined and from them a 3D reconstruction is calculated and refined.

TEM and STEM imaging can be used for tomography, each with specific strengths and…

EDS at -145C – room temperature

Material science FIB-SEM

EDS at -145C – room temperature

Energy Dispersive X-ray spectrometer (EDS) Bruker, crystal 60mm. Elemental EDS analysis of sample surface or milled cross sections.

Cryo stage down to -145 C

Material science FIB-SEM

Cryo stage down to -145 C

Cryogenic stage for visualization and processing of frozen or sensitive samples allows native preservation of the structure, reduces radiation damage caused by electron / ion beam.

FIB-SEM volume imaging

Material science FIB-SEM

FIB-SEM volume imaging

Sequential cyclic removal of nanometric layers from the sample block face and the SEM image acquisition of each newly produced surface. In this manner, hundreds to several thousand of SEM images can be collected in automatic regime, and then processed to generate a 3D dataset of…

TEM lamellae preparation

Material science FIB-SEM

TEM lamellae preparation

Preparation of a thin (~50-100 nm) site-specific specimen for subsequent TEM / STEM analytical observation (In-situ Lift-Out lamellae preparation).

Site specific cross sections

Material science FIB-SEM

Site specific cross sections

Precise site specific cross sectioning with accuracy <100 nm of a sample for subsequent imaging via integrated high resolution SEM.

Nano-scale patterning

Material science FIB-SEM

Nano-scale patterning

FIB patterning is a milling technique to engrave a surface with submicrometer size features, typically tens to several hundred nanometers.

Manipulation, mechanical properties measurements

SEM

Manipulation, mechanical properties measurements

Nano-mechanics is a field devoted to the characterization of nanomaterials or bulk material mechanical properties and behavior at the nanoscale. Measurements of the mechanical properties and the assessment of materials’ deformation mechanisms at the nanoscale have presented new…

STEM

SEM

STEM

Scanning transmission electron microscopy (STEM) is an imaging method that can be used both in TEM and SEM. In SEM extremely low accelerating voltages (2-30kV) can be used to image very thin sections. The technique requires a special detector (diode) that is mounted under the…