Crossbeam 550 (Zeiss) is a dual-beam Focused ion beam - Scanning electron (FIB-SEM) instrument. 

• 3D imaging of biological samples of cells and tissues at isotropic resolutions down to 5 nm at room temperature and at cryo conditions 
• Cryo lamellae preparation for cryo STEM analysis. 
• Enhanced resolution at low voltages and an outstanding stability for long-term 3D tomography. 
• TSEM mode ability. 

Characteristics & Accessories

FIB column

Ga+ LMIS; Accelerating voltage range 500v – 30kV; Probe current 1pA-100nA; High resolution (<3nm @30kV). Excellent spot profiles, long-term current stability. 

Gemini-II SEM column

• Schottky FEG DENKA; High resolution (1.6 nm @1kV) 
• Simultaneously operating mode FIB + high resolution SEM 
• E-T SE, Inlens SE and Energy Selective BSE detectors 
• TSEM detector 
• Multi-channel Gas Injection System C, Pt, water 
• Cryo-stage (Leica) 
• EDS Bruker (crystal 60mm)