Instrument Specification
The Zeiss Sigma 500 is a high resolution SEM. It is equipped with several detectors; the new generation E-T detector can filter out SE3 electrons, thus it collects mainly SE2 electrons and provide topographical information, the in-lens detector collects SE1 and provide high resolution surface information, the AsB provides material contrast.
Characteristics & Accessories
- Accelerating voltage: 0.3 to 30 kV
- In-Lens detector
- AsB detector
- EDS Bruker XFlash/60mm2
Location
Old Wolfson building - Room 17
Staff Contacts
-
Dr. Ifat Kaplan-Ashiri
Staff Scientist -
Dr. Xiaomeng Sui
Staff Scientist -
Dr. Neta Varsano
Staff Scientist