The Talos F200X Transmission Electron Microscope can achieve atomic resolution mode quickly due to the stability of the instrument, which provides high throughput at all operation levels.  It is equipped with a high speed camera and high speed energy dispersive X-ray spectroscopy system which provides elemental maps of a sample in minutes.  Its capabilities include 3D tomography and differential phase contrast imaging. In-situ liquid cell and electrochemical experiments are available by the use of specialised sample holders.

Key features

• Field-emission electron emitter 
• Information limit up to 110  pm 
• High-speed CMOS camera 
• STEM detectors 
• In-situ capabilities for liquid cell experiments 
• Flexible operation at 80 kV and 200 kV 

Applications

Imaging and analytical measurements of the microstructure, chemical composition, and optical properties of nanomaterials and soft matter, thin films, devices, interfaces, on the nanometer and atomic scale.