a novel XPS-based technique that was developed in our laboratory to provide nm-scale electrical information from selected surface and sub-surface domains. This includes (1) I-V curves of selected inner layers; (2) sub-surface field and work-function mapping; (3) domain-specific photovoltages; (4) atomic-scale electrical characteristics in organic molecular layers; (5) hot-electron transport characteristics; (6) novel pyroelectricity measurements; (7) a soft dielectric breakdown inspection method; and more. CREM can also be exploited to improve the bare XPS chemical analysis. A few examples are shown in the projects gallery.