Our standard XPS analyses are based on a monochromatic Al ka x-ray source and a magnetic lens incorporated within the detection setup. Thus, the spectral resolution and signal intensities are optimized, allowing fast and powerful surface-composition quantifications. The detection…
a technique dedicated to studies at improved energy resolution of the valence-electron energy bands and the secondary electron emission (SEE) spectrum. Our setup uses a He lamp at photon energies of 21.2 eV (He I) and 40.8 ev (He II). UPS can also be used to derive the sample…
a technique complementary to XPS, where a focused electron beam is used instead of the X-ray source. SAM exhibits surface sensitivity similar to that of XPS. Its chemical resolution is somewhat poorer, however its lateral resolution is by far better, down to 200 nm in our setup.
Ion scattering spectroscopy (ISS) with an Ar+ or He+ source beam, offering complementary chemical information at improved surface sensitivity; restricted, essentially, to the very top atomic layer.
Cryogenic XPS is operated down to ~100 K, which opens interesting possibilities for studies of the temperature dependence of various properties and, even more important, applying XPS to samples with relatively high vapor pressure, such as bio-samples and even specific liquids…
a novel XPS-based technique that was developed in our laboratory to provide nm-scale electrical information from selected surface and sub-surface domains. This includes (1) I-V curves of selected inner layers; (2) sub-surface field and work-function mapping; (3) domain-specific…
