Methods

 X-ray photoelectron spectroscopy (XPS)

 X-ray photoelectron spectroscopy (XPS)

Our standard XPS analyses are based on a monochromatic Al ka x-ray source and a magnetic lens incorporated within the detection setup. Thus, the spectral resolution and signal intensities are optimized, allowing fast and powerful surface-composition quantifications. The detection…

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Ultraviolet photoelectron spectroscopy (UPS)

Scanning Auger microscopy (SAM)

Ion scattering spectroscopy (ISS)

Cryogenic XPS

Chemically resolved electrical measurements (CREM)