The Dimension Edge Atomic Force Microscope
This technology provides the highest levels of performance, functionality, and accessibility in its class.
Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver the low drift and
low noise necessary to achieve publication-ready data in minutes instead of hours.
ScanAsyst imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every user.

Specifications:

• X-Y Scan Range: 90μm x 90μm typical, 85μm minimum
• Z Range: 10μm typical in imaging and force ramp modes, 9.5μm minimum
• Vertical Noise Floor: <50pm RMS inappropriate environment, typical imaging bandwidth (up to 625Hz)
• XY Position Sensor Noise Level (Closed Loop): <0.5nm RMS typical imaging bandwidth (up to 625Hz)
• Z Position Sensor Noise Level (Closed Loop): <0.2nm RMS typical imaging bandwidth (up to 625Hz)
• Sample/Size/Holder:150mm vacuum chuck, 15mm thick.
  Up to 40mm thick with optional frame spacer.
• Motorized Positioning Stage (X-Y axis): 150mm x 150mm inspectable area.
  Programmable for multi-site measurements
• Microscope Optics: 5-megapixel digital camera.
  180μm to 1465μm viewing area.
  Digital zoom and motorized focus.
• Signal Access: Configurable I/O signal access is built into the controller.
  Includes customizable signal routing, digital feedback, and dual digital lock-in
• Single Point Spectroscopy: Three-axis closed-loop control for point-and-shoot positioning and ramping.
  Spring constant calibration with a built-in thermal tune.

AFM available Modes

Contact Mode, Peak Force Tapping, TappingMode, PhaseImaging, Nanolithography (Scratching), Force Spectroscopy, Adhesion, ScanAsyst.
 
Unavailable modes:
Listed below are modes that can be considered for purchase on request.
Scanning Tunneling Microscopy, Conductive AFM, Tunneling AFM, Scanning Capacitance Microscopy, Surface Potential Microscopy, Piezoresponse Microscopy, Nanolithography (Anodic oxidation).