Instrumentation

E-Beam writer RAITH E_Line Plus Electron Beam Lithography

Patterning

AFM/SPM Dimension Edge

Inspection & Metrology

AJA Sputter ATC-1800

Additive processes

ALD- Fiji™ Plasma Atomic layer deposition system

Additive processes

Angstrom Evaporator

Additive processes

Angstrom Organic Evaporator

Additive processes

Chemical Workstations

Chemical works

Ellipsometer

Inspection & Metrology

Mask Aligner

Patterning

Microfluidics workstation

Microfluidics

MicroWriter ML®3

Patterning

Odem Evaporator

Additive processes

Olympus BX51 optical microscope

Inspection & Metrology

Optical stereo microscope Olympus SZX16

Inspection & Metrology

PECVD-Plasma-Therm Plasma Enhanced Chemical Vapor Deposition

Additive processes

Plasma Asher

Etching processes

Profilometer

Inspection & Metrology

PT ICP – Plasma Therm ICP PTI-SHUTTLELOCK

Etching processes

RTP

Thermal

Scriber

Packaging and assembly

SEM (Scanning Electron Microscope) JSM-7000F

Inspection & Metrology

SPTS ICP - Omega LPX Rapier Etch System

Etching processes

Wirebonder

Packaging and assembly

Zeta Optical Profiler

Inspection & Metrology