AFSEM-nano (Quantum Design)

Instrument Specification

The AF-SEM is an AFM which operates inside an electron microscope, allowing correlative SEM and AFM imaging.

This AFM provides standard AFM imaging, current measurements, surface potential (scanning Kelvin probe), magnetic and electric force microscopy.

This version is designed to fit in the Supra SEM, as well as Thermo-Fisher environmental SEM and Cross Beam (FIB) SEM.

 

Location

EM Unit, old Wolfson