Instrumentation

1. This microscope is placed inside an electromagnet which can reach field of 1 Tesla
2. Scanning range 5 microns xy, 700 nm z
3. Current-AFM capabilities with separate low and high amplifier ranges
4. Two-pass techniques including EFM and SKPM

The fast AFM is designated for measurements of dynamics and can function in air or in liquid. It was built in collaboration with the group of Georg Fantner at EPFL. In fast scanning mode, the tip is driven photothermally by a modulated laser. ultra-small cantilevers are employed…

Capabilities 

• Contact, tapping mode, and peak-force scanning of surfaces
• 13 x 13 x 3 micron scanner; 100 x 100 x 5 micron scanner with heating/cooling capabilities (-30 to + 100 ^oC)
• Scanning Capacitance Microscopy
• Scanning Kelvin and Scanning Electrostatic Microscopy
• M…

Integrated with a Zeiss Axiovert 200 inverted microscope with 0.55 NA condenser, 5x,10x,20xLD Plan, 63x 0.85 NA Plan objectives, 5x, 20x, 40x, 63x DIC prism turret inserts.

1. Closed-loop 100 micron scanner (15 microns in z) and automated stage integrated with optics through…

1. The AFM is placed inside of an enclosure allowing environmental control and is equipped with humidity sensor
2. Built-in optics allowing external laser illumination at the tip-surface junction between approx 300-700 nm                  
3. Variable temperature between -50^o C to +…

1. Closed Loop on all available scanners
2. Smena AFM head for working in scanning tip mode with a 100 x 100 x 15 micron scanner.
3. SU005 head for working under ambient conditions with 10 x 10 x 9 micron and 90 x 90 x 15 micron scanners.
4. Possibility to operate the bottom 100 micron…

1. Load range up to 500 mN
2. Continuous stiffness (CSM) for continuous measurement of modulus and hardness with depth
3. Variety of diamond indenter tips: Berkovich, Vickers, flat punch, spherical, Knoop