Instrument Specification
- This microscope is placed inside an electromagnet which can reach field of 1 Tesla
- Scanning range 5 microns xy, 700 nm z
- Current-AFM capabilities with separate low and high amplifier ranges
- Two-pass techniques including EFM and SKPM
Location
Goldwurm
Staff Contacts
-
Dr. Sidney Cohen
Extended Service Senior Research Fellow -
Dr. Irit Rosenhek-Goldian
Staff Scientist