Multimode AFM (Bruker AXS)

Instrument Specification

Capabilities 

  • Contact, tapping mode, and peak-force scanning of surfaces
  • 13 x 13 x 3 micron scanner; 100 x 100 x 5 micron scanner with heating/cooling capabilities (-30 to + 100 oC)
  • Scanning Capacitance Microscopy
  • Scanning Kelvin and Scanning Electrostatic Microscopy
  • Magnetic Force Microscopy
  • Liquid Cell
  • Peak-Force TUNA for current measurement with sub-picoamp sensitivity
  • PF-QNM TM mode for quantitative mechanical mapping
  • Environmental shield
  • Electrochemical STM
  • Pico-STM
  • Maximum sample size approx. 1 x 1 cm, 5 mm heigh

Location

Goldwurm

Staff Contacts