Instrument Specification
- The AFM is placed inside of an enclosure allowing environmental control and is equipped with humidity sensor
- Built-in optics allowing external laser illumination at the tip-surface junction between approx 300-700 nm
- Variable temperature between -50o C to + 100o C
- 100 x 100 x 15 micron closed-loop scanner
- Sample size up to 3 x 10 cm approx
- C-AFM with selectable amplifers allowing sensitivity of <1 pA at lowest range up to +/- 10 microAmp with correspondingly reduced sensitivity
- Contact, semicontact, EFM, MFM and KPFM (AM and FM) “top” mode and “top-I” mode capabilities
Location
Goldwurm
Staff Contacts
-
Dr. Sidney Cohen
Extended Service Senior Research Fellow -
Dr. Irit Rosenhek-Goldian
Staff Scientist