GIWAXS characterization of CdS nanowires
X-Ray Diffraction
Aligned growth of planar semiconductor nanowires (NWs) on crystalline substrates h
X-Ray Diffraction
Our combination of powerful X-ray generators, modern solid state detectors and geometrically flexible sample platforms allow high quality measurement of crystalline powders, thin films, nano-wires, and polymer fibers under a broad variety of environmental conditions.