Electron Microscopy

Energy Dispersive X-ray spectrometer (EDS) Bruker, crystal 60mm. Elemental EDS analysis of sample surface or milled cross sections at -160C to room temperature.

Sequential cyclic removal of nanometric layers from the sample block face and the SEM image acquisition of each newly produced surface. In this manner, hundreds to several thousand of SEM images can be collected in automatic regime, and then processed to generate 3D dataset of…

Cryo lamella-on-grid preparation is a FIB-based approach for the preparation of cellular samples for subsequent study by cryo-electron tomography (ET)  and which is applicable to all kinds of cells grown or deposited directly on EM grids. With the ion beam incident under a…

Nano-mechanics is a field devoted to the characterization of nanomaterials or bulk material mechanical properties and behavior at the nanoscale. Measurements of the mechanical properties and the assessment of materials’ deformation mechanisms at the nanoscale have presented new…

Scanning transmission electron microscopy (STEM) is an imaging method that can be used both in TEM and SEM. In SEM extremely low accelerating voltages (2-30kV) can be used to image very thin sections. The technique requires a special detector (diode) that is mounted under the…

Cathodoluminescence (CL) - is the emission of light as a result of the interaction of a material with the electron beam. CL spectrometer and detector in SEM can be used to characterize the composition, optical and electronic properties of materials. A CL spectrometer and detector…

Energy dispersive x-ray spectroscopy (EDS) is widely used as a chemical analysis technique in scanning electron microscopy (SEM). It enables the detection of elements both qualitatively and quantitatively simultaneously with any imaging mode of the SEM. In the last decade the…